WHAT IS MPMS?
MPMS (Magnetic Properties Measurement System) represents the culmination of design in the world of SQUID (Superconducting QUantum Interference Device) magnetometry. Providing users with the sensitivity of a SQUID magnetometer and the choice of multiple measurement modes.
DC scan mode / VSM mode / AC susceptibility mode
WHAT IS PPMS?
PPMS (Pysical Properties Measurement System) is an automated low-temperature and magnet system for the measurement of material properties like specific heat, magnetic AC and DC susceptibility and both electrical and thermal transport properties (like Hall effect, thermoelectric figure of merit and Seebeck effect).
WHAT IS MOKE?
In physics the Magneto-Optic Kerr Effect (MOKE) or the Surface Magneto-Optic Kerr Effect (SMOKE) is one of the magneto-optic effects. It describes the changes to light reflected from a magnetised surface. It is used in materials science research in devices such as the Kerr microscope, to investigate the magnetization structure of materials.
A Vibrating-Sample Magnetometer (VSM) is a scientific instrument that measures magnetic properties. A sample is first magnetized in a uniform magnetic field. It is then sinusoidally vibrated. The induced voltage in the pickup coil is proportional to the sample's magnetic moment. the induced voltage is measured with a lock-in ampliferusing the piezoelectric signal as a frequency reference. It is also possible to record the hysteresis curve of a material by sweeping the magnetic field.
WHAT IS MFM?
MFM (Magnetic Force Microscopy) is a technique derived from AFM (Atomic Force Microscopy), in which an etched silicon cantilever/tip combined with optical deflection detection is used to precisely measure local forces such as those caused by van der Waals or Coulomb interaction. MFM uses cantilevers with very low spring constant K and with magnetic coatings (typically NiCr or cobalt), sensitive to the magnetic interaction between tip and sample.
WHAT IS XRD?
XRD (X-Ray Diffraction) relies on the dual wave/particle nature of X-rays to obtain information about the structure of crystalline materials. A primary use of the technique is the identification and characterization of compounds based on their diffraction pattern.